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Structural, Optical and Photoconductive Properties of Brush Plated Copper Gallium Selenide Films

N.P. Subiramaniyam, muraliramkrish@gmail.com
Department of Electronics and Communication Systems, A.J.K. College of Arts and Science, Coimbatore, TN, India.
P. Thirunavukkarasu, muraliramkrish@gmail.com
Department of Electronics, Sri Ramakrishna Mission Vidyalaya College of Arts and Science, Coimbatore, TN, India.
K.R. Murali muraliramkrish@gmail.com
ECMS Division, CSIR-CECRI, Karaikudi, TN, India.



J. Environ. Nanotechnol., Volume 2, No 1 (March 2013) pp. 63-70

https://doi.org/10.13074/jent.2013.02.132003

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Abstract

Copper Gallium selenide films were deposited for the first time by the brush electrodeposition technique. The films were deposited at different bath temperatures in the range of 30 - 80°C at a constant current density of 3.0 mA cm- 2. The films exhibited single phase Copper Gallium selenide. Optical band gap of the film deposited at 80°C was1.68 eV. Room temperature resistivity of the films were in the range of 0.1 - 14.0 ohm cm. Photoconductivity measurements were made at room temperature. Photocurrent Capacitance voltage measurements indicated the films to exhibit p -type behaviour. The flat band potential (Vfb) was 0.60V (SCE) and a carrier density in the range of 2.5 x 1017 cm-3 was obtained. A single Photoluminescence peak was observed at 1.64 eV.

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